This paper introduces technology that was developed to measure 3D features of various surface and material types at sub-micron resolution. LCI enables automatic microtopographic imaging of challenging objects that are difficult or impossible to measure with traditional methods. Examples of such products include glossy, mirror-like and transparent surfaces and materials, such as films, sheets and inks. LCI can be used to measure fast-moving surfaces in real-time as well as stationary product samples in laboratory. Operational principle of the LCI method and its strengths and limitations are discussed. Three applications for LCI sensors and scanners on printed electronics products are examined: 1. 3D conductor trace width and cross sectional trace profile measurement. 2. Surface roughness measurement for monitoring Ra/Rz value of substrates and printed surfaces. 3. Thickness/height measurement of printed features.
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